Il Nuovo Cimento C
Year 2022 - Issue 6 - November-December
SIF Congress 2021
Displacement Damage induced in 150 nm CMOS SPADs by 2 MeV electrons
Authors: E. Ponticelli
DOI: 10.1393/ncc/i2022-22210-9
Published online 11 August 2022
Article: 210
Open Access
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