Year 2021 - Issue 4-5 - July-October
SIF Congress 2020

Quantitative material characterization based on the spectral decomposition of X-ray tomographic images

Authors: S. Vrbaski, R. Longo, A. Taibi, A. Contillo
DOI: 10.1393/ncc/i2021-21144-0
Published online 3 September 2021
Article: 144
Open Access
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