Il Nuovo Cimento C

Year 2013 - Issue 2 - March-April
Nanoforum 2012 - VIII edition

Scanning probe microscopy techniques for mechanical characterization at nanoscale

Authors: D. Passeri, P. Anastasiadis, E. Tamburri,V. Guglielmotti, M. Rossi
DOI: 10.1393/ncc/i2013-11511-9
pp. 83-88
Published online 16 May 2013
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